Don’t waste your time. This common detection method cannot help you identify fake chips.
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-原创内容,请勿转载。
一些假冒伪劣元器件的检测方法和过程实际上无法识别某些元器件,因此这也是假冒元器件经过层层把控后仍流入供应链的主要原因,其中包括许多国防和军工级元器件。不是组件可以逃脱这种命运。今天就和大家分享一些很多人平时都会做的流程,但是在成分筛选方法中很容易无效。

元器件外包装检验

标签识别
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第一个是标签识别。按照正常的逻辑,我们可以找到一个原汁原味的元器件标签,并将其与新购买的元器件标签进行比对,包括它的 LOGO 位置、字体大小、粗细、框架大小和排版等,然后就可以确认真假了。一目了然,其实这么说是对的吗?

但是,这种方法会遇到一个很大的挑战,那就是元件标签会因生产日期不同而发生变化。更复杂的是,当一些品牌被合并、收购、重组时,标签LOGO可能会发生变化,这就需要买家有大量的标签进行对比,而且随着零部件的时刻变化,需要加上自己的对比标签库,这是很多终端购买都做不到的事情。


与标签一样,组件外包装中的外箱、包装膜、包装泡沫、托盘、干燥剂等都会根据组件的产地或市场因素而变化,这也增加了鉴别的难度。


Appearance inspection equipment

many companies will purchase appearance inspection equipment to conduct product appearance inspection, which can avoid manual inspection errors. But what you don't know is that some fake and shoddy components can escape instrument detection.  

图像采集
• 
使用相机和其他设备对要检查的 IC 进行照片或视频记录,获取 IC 的外观图像,并筛选其外观。

• 此步骤需要原装和正品组件进行比较,但不同产地和不同时间线的产品外观不同。如果无法获得不同时期正品组件的外观作为参考对象,则此测试通常无效。因为很多组件的打标代码也会随着不同的周期而变化。

特征匹配
• 外观的进一步筛选是将提取的特征与预设的特征进行匹配,以确定IC是否符合标准,例如是否存在缺陷、偏差等,

• 元器件的封装通常遵循独特的标准。一些假冒组件伪装成不同品牌的原装正品芯片,并带有外包装。仅凭外观很难识别这部分假冒产品。

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清除标记
• 特征匹配后,通常会进行以下筛选。IC 上的标志是否清晰可见,无模糊、破损、漏印等。IC 的外观应完好无损,无划痕、裂纹或变形。

• 正如刚才提到的,一些假冒原件不是重新打字或翻新的,而是由其他品牌最初生产的组件假冒的。这些假冒部件的外观与正品一样完整,可以轻松逃脱专业仪器。的检测进入我们的供应链。

• 我认为无法区分真假元件的另一种测试方法是可焊性测试。


焊点可靠性测试
• 这种类型的检查是对焊点外观是否符合标准的目视检查。或采用X射线检测焊点内部质量问题,超声波探伤等方法检测焊点内部问题。但是,这只是为了了解芯片的可焊性。它无法识别假冒和劣质芯片,因为假冒组件很多。可焊性完整完整。

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SO, it is necessary to make detection plans based on different component types to identify real and fake components. Gradually, conventional detection and screening methods can no longer distinguish.






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