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Specialty Logic
Alarms, Buzzers, and Sirens
Results:
1870
Filters
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Stacked
Scrolling
Manufacturer
- Advanced Micro Devices
- Analog Devices Inc./Maxim Integrated
- Cypress Semiconductor Corp
- Diodes Incorporated
- Fairchild Semiconductor
- Harris Corporation
- Intel
- Intersil
- LSI/CSI
- Microchip Technology
- Motorola
- National Semiconductor
- Nexperia USA Inc.
- NTE Electronics, Inc
- NXP Semiconductors
- NXP USA Inc.
- onsemi
- Quality Semiconductor
- Renesas Design Germany GmbH
- Renesas Electronics America Inc
- Rochester Electronics, LLC
- SMSC
- STMicroelectronics
- Texas Instruments
Series
- *
- -
- 100E
- 100EL
- 100EP
- 100LVEL
- 100LVEP
- 100S
- 10E
- 10EL
- 10EP
- 10H
- 4000
- 4000B
- 4007UB
- 4008B
- 5483A
- 54C
- 54F
- 54H
- 54HC
- 54HCT
- 54LS
- 54S
- 7400
- 74ABT
- 74ABTE
- 74ABTH
- 74AC
- 74ACT
- 74AS
- 74AUP
- 74BCT
- 74C
- 74F
- 74FB
- 74GTLP
- 74HC
- 74HCT
- 74LS
- 74LV
- 74LVC
- 74LVCE
- 74LVCZ
- 74LVT
- 74LVTH
- 74LVX
- 74S
- 74SSQEB
- 74SSTL
- 74SSTU
- 74SSTUB
- 74SSTV
- 74SSTVF
- 74VHC
- 8206
- 9304
- ATE
- Automotive, AEC-Q100
- Automotive, AEC-Q100, 74LVC
- FM
- GreenPAK 3™
- MC
- MC1000
- MC1200
- SY58
- SY89
Package
- Bag
- Bulk
- Cut Tape (CT)
- Tape & Reel (TR)
- Tray
- Tube
Product Status
- Active
- Discontinued at /
- Last Time Buy
- Not For New Designs
- Obsolete
Operating Temperature
- -
- -20°C ~ 70°C
- -40°C ~ 125°C
- -40°C ~ 125°C (TA)
- -40°C ~ 85°C
- -40°C ~ 85°C (TA)
- -55°C ~ 125°C
- -55°C ~ 125°C (TA)
- 0°C ~ 70°C
- 0°C ~ 75°C
- 0°C ~ 85°C
Mounting Type
- -
- Surface Mount
- Through Hole
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Img
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Pdf
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Part Number
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Manufacturers
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Desc
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In Stock
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Packing
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Scan Test Device with Inverting Buffers IC 24-SOIC
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5783
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24-SOIC (0.295", 7.50mm Width)
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1:1, 1:2 Configurable Registered Buffer with Parity IC 96-LFBGA (13.5x5.5)
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8469
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96-LFBGA
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Scan Test Device with Inverting Buffers IC 24-PDIP
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3147
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24-DIP (0.300", 7.62mm)
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Binary Full Adder with Fast Carry IC 16-DIP
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1872
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16-DIP (0.300", 7.62mm)
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Arithmetic Logic Unit IC 24-SOIC
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8255
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24-SOIC (0.295", 7.50mm Width)
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Binary Full Adder with Fast Carry IC 16-TSSOP
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5961
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16-TSSOP (0.173", 4.40mm Width)
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Arithmetic Logic Unit IC 24-SOIC
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7980
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24-SOIC (0.295", 7.50mm Width)
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Binary Full Adder with Fast Carry IC 16-TSSOP
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5011
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16-TSSOP (0.173", 4.40mm Width)
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Arithmetic Logic Unit IC 24-SOIC
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8254
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24-SOIC (0.295", 7.50mm Width)
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Arithmetic Logic Unit IC 24-SOIC
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9954
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24-SOIC (0.295", 7.50mm Width)
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Arithmetic Logic Unit IC 24-PDIP
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5935
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24-DIP (0.300", 7.62mm)
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Arithmetic Logic Unit IC 24-PDIP
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8209
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24-DIP (0.300", 7.62mm)
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Binary Full Adder with Fast Carry IC 16-SO
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7791
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16-SOIC (0.209", 5.30mm Width)
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Scan Test Device with Bus Transceivers IC 24-PDIP
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7290
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24-DIP (0.300", 7.62mm)
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Binary Full Adder with Fast Carry IC 16-SO
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6639
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16-SOIC (0.209", 5.30mm Width)
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Scan Test Device with Bus Transceivers IC 24-PDIP
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1924
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24-DIP (0.300", 7.62mm)
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Schottky Barrier Diode Bus-Termination Array IC 16-SOIC
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4016
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16-SOIC (0.154", 3.90mm Width)
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Scan Test Device with D-Type Latches IC 24-SOIC
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5215
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24-SOIC (0.295", 7.50mm Width)
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Scan Test Device with D-Type Latches IC 24-SOIC
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8059
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24-SOIC (0.295", 7.50mm Width)
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TTL/BTL Registered Transceiver IC 52-QFP (10x10)
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7459
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52-QFP
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Scan Test Device with D-Type Latches IC 24-PDIP
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1324
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24-DIP (0.300", 7.62mm)
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TTL/BTL Registered Transceiver IC 52-QFP (10x10)
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3444
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52-QFP
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Scan Test Device with Inverting Buffers IC 24-SOIC
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5945
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24-SOIC (0.295", 7.50mm Width)
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Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
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1416
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24-SOIC (0.295", 7.50mm Width)
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Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC
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3900
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24-SOIC (0.295", 7.50mm Width)
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Scan Test Device with Inverting Buffers IC 24-PDIP
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8698
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24-DIP (0.300", 7.62mm)
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Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP
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9158
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24-DIP (0.300", 7.62mm)
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Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-PDIP
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6019
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24-DIP (0.300", 7.62mm)
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Scan Test Device with Buffers IC 24-SOIC
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6438
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24-SOIC (0.295", 7.50mm Width)
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Scan Test Device with Buffers IC 24-PDIP
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1576
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24-DIP (0.300", 7.62mm)
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