A Comprehensive Guide To TIBPAL20L8-7CFN * Programmable Logic Device (PLD) IC Macrocells

* Programmable Logic Device (PLD) IC Macrocells

General Description

These programmable array logic devices feature high speed and functional equivalency when compared with currently available

devices. These IMPACT-X™ circuits combine the latest Advanced Low-Power Schottky technology with proven titanium-tungsten

fuses to provide reliable, high-performance substitutes for conventional TTL logic. Their easy programmability allows for quick

design of custom functions and typically results in a more compact circuit board. In addition, chip carriers are available for futher

reduction in board space.

All of the register outputs are set to a low level during power-up. Extra circuitry has been provided to allow loading of each

register asynchronously to either a high or low state. This feature simplifies testing because the registers can be set to an initial

state prior to executing the test sequence.

The TIBPAL20’C series is characterized from 0℃ to 75°C. The TIBPAL20’M series is characterized for operation over the full

military temperature range of -55℃ to 125°C.

Features

• High-Performance Operation:

   fmax (no feedback)

      TIBPAL20R’-7C Series...100 MHz

      TIBPAL20R’-10M Series...62.5 MHz

   fmax (internal feedback)

      TIBPAL20R’-7C Series...100 MHz

      TIBPAL20R’-10M Series...62.5 MHz

   fmax (external feedback)

      TIBPAL20R’-7C Series...74 MHz

      TIBPAL20R’-10M Series ...50 MHz

   Propagation Delay

      TIBPAL20L8-7C Series...7 ns Max

      TIBPAL20L8-10M Series...10 ns Max

• Functionally Equivalent,but Faster Than Existing 24-Pin PLD Circuits

• Preload Capability on Output Registers Simplifies Testing

• Power-Up Clear on Registered Devices (All Register Outputs are Set Low, but Voltage Levels at the Output Pins Go High)

• Package Options Include Both Plastic and Ceramic Chip Carriers in Addition to Plastic and Ceramic DIPs

• Security Fuse Prevents Duplication

• Dependable Texas Instruments Quality and Reliability

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